Propiedades
General
| Property | Temperature | Value | Comment |
|---|---|---|---|
Densidad | 23.0 °C | 4.72 g/cm³ Show Supplier Material materials with Densidad of 4.72 g/cm³ | For ceramic structural parts |
Mecánica
| Property | Temperature | Value | Comment |
|---|---|---|---|
Resistencia a la flexión | 23.0 °C | 200 MPa Show Supplier Material materials with Resistencia a la flexión of 200 MPa | For ceramic structural parts |
Aplicaciones térmicas
| Property | Temperature | Value | Comment |
|---|---|---|---|
Coeficiente de dilatación térmica | 23.0 °C | 6.2E-6 1/K Show Supplier Material materials with Coeficiente de dilatación térmica of 6.2E-6 1/K | For ceramic structural parts |
Conductividad térmica | 23.0 °C | 47 W/(m·K) Show Supplier Material materials with Conductividad térmica of 47 W/(m·K) | For ceramic structural parts |
Temperatura de fusión | 2254 °C Show Supplier Material materials with Temperatura de fusión of 2254 °C |
Eléctrico
| Property | Temperature | Value | Comment |
|---|---|---|---|
Conductividad eléctrica | 23.0 °C | 66500 S/m Show Supplier Material materials with Conductividad eléctrica of 66500 S/m | For ceramic structural parts |
Resistividad eléctrica | 23.0 °C | 1.5E-8 Ω·m Show Supplier Material materials with Resistividad eléctrica of 1.5E-8 Ω·m | For ceramic structural parts |
Technological properties
| Property | ||
|---|---|---|
| Application areas | Thermionic emission (cathode), Plasma source for plasma enhanced coating(PECVD), Vacuum electron beam welding machine, Electron beam surface reforming device, Electron beam lithography device, Transmission electron microscope, Scanning electron microscope, Surface analysis device, Radiotherapy devices | |
| Chemical composition | LaB6 (% min.) 99.9%, B(% min.) 31% - Impurities: Ce <120ppm, Fe <250ppm, Pr <150ppm, Si <100ppm, Nd <180ppm, Ca <90ppm, Sm <112ppm, C <300ppm, Y <250ppm, Mg <100ppm, Ti <100ppm | |
| Crystal structure | Polycrystalline | |